mlsem/dics/bin2.json

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{
"index":12,
"title":"Application: Interpretable Device Failure",
"paper":"Interpretable, Multidimensional, Multimodal Anomaly Detection with Negative Sampling for Detection of Device Failure",
"by": "Sipple et al",
"when": "2020",
"who": "Bin Li",
"mail": "bin.li@tu-dortmund.de",
"note1":"real world data is messy",
"note2":"detect IOT devices that fail",
"ext": "png"
}